Laboratory of Scanning Electron Microscopy
This course is part of the programme:
Physics (Third Level)
Objectives and competences
- To make the students introduced to the basics of Scanning Electron microscopy and related techniques (EDX, CL)
- To present some selected case studies
- To get practical hands-on experience and basic authonomy in imaging, elemental analysis and sample preparation.
Content (Syllabus outline)
1. Introduction to Scanning Electron Microscopy: motivations, typical investigated systems, apparatus
2. Surface morphology investigation with secondary electrons
3. Surface topography exploiting elemental contrast with backscattered electrons
4. Energy dispersive X-Ray spectroscopy (EDX): principles, qualitative and quantitative mapping and spectroscopy.
5. Cathodoluminescence spectroscopy (CL): principles and some case studies.
6. Sample preparation: general guidelines and some examples
Intended learning outcomes
Knowledge and understanding:
- Basic knowledge about Scanning Electron Microscopy and related techniques (EDX, CL)
- At the end of the course the student is authonomous in planning a measurement session, in preparing a sample and in its morphological and elemental analysis at a basic level
1. J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, Kluwer Academic / Plenum Publisher (New York) 2003
2. Selected papers
- Practical session of sample analysis • Written report on practical session results and seminar presentation • Oral exam (25/50/25)
Associate professor of Physics at the University of Nova Gorica.
University course code: 3FIi26
Year of study: 1
- Lectures: 10 hours
- Exercises: 45 hours
- Individual work: 35 hours
Course type: elective
Learning and teaching methods:
lectures and practical training with the students on the sem/edx/cl apparatus and with sample preparation facilities. individual meetings will be done for the preparation of a written report and the seminar on a selected topic of related to sem technique.