Laboratory of Scanning Electron Microscopy
This course is part of the programme:
Materials (Third Level)
Objectives and competences
- To make the students introduced to the basics of Scanning Electron microscopy and related techniques (EDX, CL)
- To present some selected case studies
- To get practical hands-on experience and basic authonomy in imaging, elemental analysis and sample preparation.
Content (Syllabus outline)
1. Introduction to Scanning Electron Microscopy: motivations, typical investigated systems, apparatus
2. Surface morphology investigation with secondary electrons
3. Surface topography exploiting elemental contrast with backscattered electrons
4. Energy dispersive X-Ray spectroscopy (EDX): principles, qualitative and quantitative mapping and spectroscopy.
5. Cathodoluminescence spectroscopy (CL): principles and some case studies.
6. Sample preparation: general guidelines and some examples
Intended learning outcomes
Knowledge and understanding:
- Basic knowledge about Scanning Electron Microscopy and related techniques (EDX, CL)
- At the end of the course the student is authonomous in planning a measurement session, in preparing a sample and in its morphological and elemental analysis at a basic level
1. J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, Kluwer Academic / Plenum Publisher (New York) 2003
2. Selected papers
- Practical session of sample analysis • Written report on practical session results and seminar presentation • Oral exam (25/50/25)
Associate professor of material science at the University of Nova Gorica.
EMIN, Saim, ABDI, Fatwa F. Abdi, FANETTI, Mattia, PENG, Wei, SMITH, W., SIVULA, K., DAM, Bernard, VALANT, Matjaž. A novel approach for the preparation of textured CuO thin films from electrodeposited CuCl and CuBr. Journal of electroanalytical chemistry, ISSN 1572-6657, 2014, vol. 717-718, str. 243-249, doi: 10.1016/j.jelechem.2014.01.038. [COBISS.SI-ID 3243515]
LISJAK, Darja, OVTAR, Simona, KOVAČ, Janez, GREGORATTI, Luca, ALEMAN, Belen, AMATI, Matteo, FANETTI, Mattia, MAKOVEC, Darko. A surface-chemistry study of barium ferrite nanoplates with DBSa-modified surfaces. Applied Surface Science, ISSN 0169-4332. [Print ed.], 2014, vol. 305, str. 366-374, doi: 10.1016/j.apsusc.2014.03.092. [COBISS.SI-ID 27593511]
FANETTI, Mattia, AMBROSINI, Stefano, AMATI, Matteo, GREGORATTI, Luca, ABYANEH, M. K., FRANCIOSI, A., CHIA, A. C. E., LAPIERRE, R. R., RUBINI, Silvia. Monitoring the Fermi-level position within the bandgap on a single nanowire : a tool for local investigations of doping. Journal of applied physics, ISSN 0021-8979, 2013, vol. 114, no. 15, str. 154308-1-154308-9, doi:10.1063/1.4826198. [COBISS.SI-ID 3196411]
FANETTI, Mattia, et al. Structure and molecule : substrate interaction in a Co-octaethyl porphyrin monolayer on the Ag(110) surface. The journal of physical chemistry. C, Nanomaterials and interfaces, ISSN 1932-7447, 2011, vol. 115, no. 23, str. 11560-11568. [COBISS.SI-ID 2254843]
BALOG, Richard, FANETTI, Mattia, et al. Bandgap opening in graphene induced by patterned hydrogen adsorption. Nature materials, ISSN 1476-1122, 2010, vol. 9, no. 4, str. 315-319. [COBISS.SI-ID 2261243]
FANETTI, Mattia, GAVIOLI, Luca, CEPEK, Cinzia, SANCROTTI, Massimo. Orientation of C60 molecules in the (3 sqrt3 × 3 sqrt3) R30° and (sqrt13 x sqrt13) R14° phases of C60/Ge(111) single layers. Physical review. B, Condensed matter and materials physics, ISSN 1098-0121, 2008, vol. 77, no. 8, str. 085420-1-085420-7. [COBISS.SI-ID 2255867]
FANETTI, Mattia, GAVIOLI, Luca, SANCROTTI, Massimo. Long-range-ordered, molecular-induced nanofaceting. Advanced materials, ISSN 0935-9648, 2006, vol. 18, no. 21, str. 2863-2867. [COBISS.SI-ID 2253563]
University course code: 3FIi26*
Year of study: 1
- Lectures: 10 hours
- Exercises: 45 hours
- Individual work: 35 hours
Course type: elective
Learning and teaching methods:
lectures and practical training with the students on the sem/edx/cl apparatus and with sample preparation facilities. individual meetings will be done for the preparation of a written report and the seminar on a selected topic of related to sem technique.