X-ray diffraction

Equipment: Advanced X-ray diffractometer SmartLab SE

Contact person: dr. Andraž Mavrič (andraz.mavric@ung.si)

Source: Cu anode 2.2 kW (CuKα1 = 1.5406 Å)

Detector: 1D semiconductor detector D/teX Ultra 250

• Powder measurements:
  • Bragg-Bretano geometry
  • Parallel beam geometry
  • High temperature measurements (DHS1100 Anton Paar)
• Thin film analysis:
  • Bragg-Bretano geometry
  • Parallel beam geometry
  • X-ray reflectivity - XRR
  • Pole figure
  • Rocking curve
  • Reciprocal space mapping
• Small Angle X-ray Scattering (SAXS)

Access: Contact dr. Andraž Mavrič (andraz.mavric@ung.si) with a proposed experimental plan.

X-ray powder diffractometer Rigaku MiniFlex600 with D/tex Ultra detector